Rapid thermal annealing in silicon diode and photodiode technologies

Aleksandra S. Kim, Natalya A. Perevedentseva, Sergey Yu. Yurchuck, Fedor D. Korzhov

Open source

DOI: 10.3897/j.moem.11.4.175359
Published: 2025-12-01
Container: Modern Electronic Materials
Publisher: Pensoft Publishers
Open access: unknown

Credibility signals

uncertain Score 64/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.

Show all credibility signals

supportingDOI registered: A matching record was returned by Crossref. Source: Crossref; license: CC0 metadata
supportingDOI resolves: A matching record was returned by Crossref. Source: Crossref; license: CC0 metadata
not scoredDirectory of Open Access Journals: No matching DOAJ record was present in this response. No allow-list match; this is not evidence of low credibility. Source: DOAJ; license: CC0
not scoredMEDLINE indexed: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredOpenAlex core source: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredKnown publisher allow-list: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredROR affiliation: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredRetraction Watch retraction: No retraction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch expression of concern: No expression of concern notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch correction: No correction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch reinstatement: No reinstatement notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredOpen access status: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredPublication license: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredPublication version: A publication version was supplied but is not scored. Source: Normalized work metadata; license: Caller-provided; provenance license not supplied to scorer
supportingMetadata completeness: All 6 scored descriptive metadata groups are present. Source: Normalized work metadata; license: Caller-provided; provenance license not supplied to scorer

Cite this work

BibTeX

@article{allodium:10.3897/j.moem.11.4.175359,
  title = {Rapid thermal annealing in silicon diode and photodiode technologies},
  author = {Aleksandra S. Kim and Natalya A. Perevedentseva and Sergey Yu. Yurchuck and Fedor D. Korzhov},
  year = {2025},
  journal = {Modern Electronic Materials},
  doi = {10.3897/j.moem.11.4.175359},
  url = {https://doi.org/10.3897/j.moem.11.4.175359}
}

RIS

TY  - JOUR
TI  - Rapid thermal annealing in silicon diode and photodiode technologies
AU  - Aleksandra S. Kim
AU  - Natalya A. Perevedentseva
AU  - Sergey Yu. Yurchuck
AU  - Fedor D. Korzhov
PY  - 2025
JO  - Modern Electronic Materials
DO  - 10.3897/j.moem.11.4.175359
UR  - https://doi.org/10.3897/j.moem.11.4.175359
ER  -

APA

Kim, A. S., Perevedentseva, N. A., Yurchuck, S. Y., & Korzhov, F. D. (2025). Rapid thermal annealing in silicon diode and photodiode technologies. Modern Electronic Materials. https://doi.org/10.3897/j.moem.11.4.175359

Source records

crossref · retrieved 2026-09-25T08:33:48.228Z