Effect of low-energy electron irradiation on voltage-capacity curves of Al/SiO2/Si structure

Yuriy O. Kulanchikov, Pavel S. Vergeles, Eugene B. Yakimov

Open source

DOI: 10.3897/j.moem.5.4.52311
Published: 2019-12-31
Container: Modern Electronic Materials
Publisher: Pensoft Publishers
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.3897/j.moem.5.4.52311,
  title = {Effect of low-energy electron irradiation on voltage-capacity curves of Al/SiO2/Si structure},
  author = {Yuriy O. Kulanchikov and Pavel S. Vergeles and Eugene B. Yakimov},
  year = {2019},
  journal = {Modern Electronic Materials},
  doi = {10.3897/j.moem.5.4.52311},
  url = {https://doi.org/10.3897/j.moem.5.4.52311}
}

RIS

TY  - JOUR
TI  - Effect of low-energy electron irradiation on voltage-capacity curves of Al/SiO2/Si structure
AU  - Yuriy O. Kulanchikov
AU  - Pavel S. Vergeles
AU  - Eugene B. Yakimov
PY  - 2019
JO  - Modern Electronic Materials
DO  - 10.3897/j.moem.5.4.52311
UR  - https://doi.org/10.3897/j.moem.5.4.52311
ER  -

APA

Kulanchikov, Y. O., Vergeles, P. S., & Yakimov, E. B. (2019). Effect of low-energy electron irradiation on voltage-capacity curves of Al/SiO2/Si structure. Modern Electronic Materials. https://doi.org/10.3897/j.moem.5.4.52311

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crossref · retrieved 2026-09-24T21:54:38.259Z