Characterization of Vacancy-Type Defects in Mg- and N-Implanted GaN by using a Monoenergetic Positron Beam
- DOI
- 10.48505/nims.5766
- Published
- 2025
- Container
- Not recorded
- Publisher
- IEEE
- Open access
- no
Credibility signals
limited evidence Score 45/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.
Show all credibility signals
- cautionDOI registered: No matching Crossref record was present in this response.
- cautionDOI resolves: No matching Crossref record was present in this response.
- not scoredDirectory of Open Access Journals: No matching DOAJ record was present in this response. No allow-list match; this is not evidence of low credibility.
- not scoredMEDLINE indexed: Not checked or no result supplied; no credibility inference made.
- not scoredOpenAlex core source: Not checked or no result supplied; no credibility inference made.
- not scoredKnown publisher allow-list: Not checked or no result supplied; no credibility inference made.
- not scoredROR affiliation: Not checked or no result supplied; no credibility inference made.
- not scoredRetraction Watch retraction: No retraction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete.
- not scoredRetraction Watch expression of concern: No expression of concern notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete.
- not scoredRetraction Watch correction: No correction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete.
- not scoredRetraction Watch reinstatement: No reinstatement notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete.
- not scoredOpen access status: Not checked or no result supplied; no credibility inference made.
- supportingPublication license: A publication license was supplied: http://rightsstatements.org/vocab/InC/1.0/. Presence improves reuse transparency, not research validity.
- not scoredPublication version: A publication version was supplied but is not scored.
- cautionMetadata completeness: 5 of 6 scored descriptive metadata groups are present; missing fields increase uncertainty.
Cite this work
BibTeX
@article{allodium:10.48505/nims.5766,
title = {Characterization of Vacancy-Type Defects in Mg- and N-Implanted GaN by using a Monoenergetic Positron Beam},
author = {Akira Uedono and Ryo Tanaka and Shinya Takashima and Katsunori Ueno and Masaharu Edo and Kohei Shima and Shigefusa F. Chichibu and Jun Uzuhashi and Tadakatsu Ohkubo and Shoji Ishibashi and Kacper Sierakowski and Michal Bockowski},
year = {2025},
doi = {10.48505/nims.5766},
url = {https://doi.org/10.48505/nims.5766}
}RIS
TY - JOUR TI - Characterization of Vacancy-Type Defects in Mg- and N-Implanted GaN by using a Monoenergetic Positron Beam AU - Akira Uedono AU - Ryo Tanaka AU - Shinya Takashima AU - Katsunori Ueno AU - Masaharu Edo AU - Kohei Shima AU - Shigefusa F. Chichibu AU - Jun Uzuhashi AU - Tadakatsu Ohkubo AU - Shoji Ishibashi AU - Kacper Sierakowski AU - Michal Bockowski PY - 2025 DO - 10.48505/nims.5766 UR - https://doi.org/10.48505/nims.5766 ER -
APA
Uedono, A., Tanaka, R., Takashima, S., Ueno, K., Edo, M., Shima, K., Chichibu, S. F., Uzuhashi, J., Ohkubo, T., Ishibashi, S., Sierakowski, K., & Bockowski, M. (2025). Characterization of Vacancy-Type Defects in Mg- and N-Implanted GaN by using a Monoenergetic Positron Beam. https://doi.org/10.48505/nims.5766
Source records
- datacite · retrieved 2026-09-26T07:16:43.455Z