Online Open-World Wafer Defect Discovery using Hyperdimensional Computing
- DOI
- 10.48550/arxiv.2610.28949
- Published
- 2026
- Container
- Not recorded
- Publisher
- arXiv
- Open access
- no
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limited evidence Score 41/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.
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Cite this work
BibTeX
@article{allodium:10.48550/arxiv.2610.28949,
title = {Online Open-World Wafer Defect Discovery using Hyperdimensional Computing},
author = {Zhao, Quanling and Emami, Ava and Idé, Tsuyoshi and Joshi, Rajiv and Holmes, Steven and Passow, Michael and Rosing, Tajana},
year = {2026},
doi = {10.48550/arxiv.2610.28949},
url = {https://doi.org/10.48550/arxiv.2610.28949}
}RIS
TY - JOUR TI - Online Open-World Wafer Defect Discovery using Hyperdimensional Computing AU - Zhao, Quanling AU - Emami, Ava AU - Idé, Tsuyoshi AU - Joshi, Rajiv AU - Holmes, Steven AU - Passow, Michael AU - Rosing, Tajana PY - 2026 DO - 10.48550/arxiv.2610.28949 UR - https://doi.org/10.48550/arxiv.2610.28949 ER -
APA
Quanling, Z., Ava, E., Tsuyoshi, I., Rajiv, J., Steven, H., Michael, P., & Tajana, R. (2026). Online Open-World Wafer Defect Discovery using Hyperdimensional Computing. https://doi.org/10.48550/arxiv.2610.28949
Source records
- datacite · retrieved 2026-11-06T19:53:48.380Z