Compact test platform for in-situ indentation and scratching inside a scanning electron microscope (SEM)

Rabe, Rodolfo

DOI: 10.5075/epfl-thesis-3593
Published: 2006
Container: Not recorded
Publisher: Lausanne, EPFL
Open access: yes

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Cite this work

BibTeX

@article{allodium:10.5075/epfl-thesis-3593,
  title = {Compact test platform for in-situ indentation and scratching inside a scanning electron microscope (SEM)},
  author = {Rabe, Rodolfo},
  year = {2006},
  doi = {10.5075/epfl-thesis-3593},
  url = {https://doi.org/10.5075/epfl-thesis-3593}
}

RIS

TY  - JOUR
TI  - Compact test platform for in-situ indentation and scratching inside a scanning electron microscope (SEM)
AU  - Rabe, Rodolfo
PY  - 2006
DO  - 10.5075/epfl-thesis-3593
UR  - https://doi.org/10.5075/epfl-thesis-3593
ER  -

APA

Rodolfo, R. (2006). Compact test platform for in-situ indentation and scratching inside a scanning electron microscope (SEM). https://doi.org/10.5075/epfl-thesis-3593

Source records

datacite · retrieved 2026-09-25T19:44:20.453Z