The Grinding Influence On The Strength Of Fan-Out Wafer-Level Packages

Z. W. Zhong, C. Xu, W. K. Choi

Open source

DOI
10.5281/zenodo.1316230
Published
2018
Container
Not recorded
Publisher
Zenodo
Open access
yes

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BibTeX

@article{allodium:10.5281/zenodo.1316230,
  title = {The Grinding Influence On The Strength Of Fan-Out Wafer-Level Packages},
  author = {Z. W. Zhong and C. Xu and W. K. Choi},
  year = {2018},
  doi = {10.5281/zenodo.1316230},
  url = {https://doi.org/10.5281/zenodo.1316230}
}

RIS

TY  - JOUR
TI  - The Grinding Influence On The Strength Of Fan-Out Wafer-Level Packages
AU  - Z. W. Zhong
AU  - C. Xu
AU  - W. K. Choi
PY  - 2018
DO  - 10.5281/zenodo.1316230
UR  - https://doi.org/10.5281/zenodo.1316230
ER  - 

APA

Zhong, Z. W., Xu, C., & Choi, W. K. (2018). The Grinding Influence On The Strength Of Fan-Out Wafer-Level Packages. https://doi.org/10.5281/zenodo.1316230

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