EllipSect: A surface brightness analysis tool for GALFIT output

Añorve, Christopher, Reyes-Amador, Ulises, de Ramon Toledo, Diego, Ríos-López, Emmanuel, López-Cruz, Omar

Open source

DOI
10.5281/zenodo.22016423
Published
2026
Container
Not recorded
Publisher
Zenodo
Open access
no

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BibTeX

@article{allodium:10.5281/zenodo.22016423,
  title = {EllipSect: A surface brightness analysis tool for GALFIT output},
  author = {Añorve, Christopher and Reyes-Amador, Ulises and de Ramon Toledo, Diego and Ríos-López, Emmanuel and López-Cruz, Omar},
  year = {2026},
  doi = {10.5281/zenodo.22016423},
  url = {https://doi.org/10.5281/zenodo.22016423}
}

RIS

TY  - JOUR
TI  - EllipSect: A surface brightness analysis tool for GALFIT output
AU  - Añorve, Christopher
AU  - Reyes-Amador, Ulises
AU  - de Ramon Toledo, Diego
AU  - Ríos-López, Emmanuel
AU  - López-Cruz, Omar
PY  - 2026
DO  - 10.5281/zenodo.22016423
UR  - https://doi.org/10.5281/zenodo.22016423
ER  - 

APA

Christopher, A., Ulises, R., Diego, D. R. T., Emmanuel, R., & Omar, L. (2026). EllipSect: A surface brightness analysis tool for GALFIT output. https://doi.org/10.5281/zenodo.22016423

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