TCAD-Based Mechanism-Resolved Modeling of Displacement-Damage and Interface-Trap Contributions to Dark Current in BSI Pinned Photodiodes
- DOI
- 10.5281/zenodo.22104938
- Published
- 2026
- Container
- Not recorded
- Publisher
- Zenodo
- Open access
- yes
Credibility signals
limited evidence Score 47/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.
Show all credibility signals
- cautionDOI registered: No matching Crossref record was present in this response.
- cautionDOI resolves: No matching Crossref record was present in this response.
- not scoredDirectory of Open Access Journals: No matching DOAJ record was present in this response. No allow-list match; this is not evidence of low credibility.
- not scoredMEDLINE indexed: Not checked or no result supplied; no credibility inference made.
- not scoredOpenAlex core source: Not checked or no result supplied; no credibility inference made.
- not scoredKnown publisher allow-list: Not checked or no result supplied; no credibility inference made.
- not scoredROR affiliation: Not checked or no result supplied; no credibility inference made.
- not scoredRetraction Watch retraction: No retraction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete.
- not scoredRetraction Watch expression of concern: No expression of concern notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete.
- not scoredRetraction Watch correction: No correction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete.
- not scoredRetraction Watch reinstatement: No reinstatement notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete.
- supportingOpen access status: Normalized open-access status: open.
- supportingPublication license: A publication license was supplied: https://creativecommons.org/licenses/by/4.0/legalcode. Presence improves reuse transparency, not research validity.
- not scoredPublication version: A publication version was supplied but is not scored.
- cautionMetadata completeness: 5 of 6 scored descriptive metadata groups are present; missing fields increase uncertainty.
Cite this work
BibTeX
@article{allodium:10.5281/zenodo.22104938,
title = {TCAD-Based Mechanism-Resolved Modeling of Displacement-Damage and Interface-Trap Contributions to Dark Current in BSI Pinned Photodiodes},
author = {Zhao, Lei and Yang, Bifeng and Song, TIng},
year = {2026},
doi = {10.5281/zenodo.22104938},
url = {https://doi.org/10.5281/zenodo.22104938}
}RIS
TY - JOUR TI - TCAD-Based Mechanism-Resolved Modeling of Displacement-Damage and Interface-Trap Contributions to Dark Current in BSI Pinned Photodiodes AU - Zhao, Lei AU - Yang, Bifeng AU - Song, TIng PY - 2026 DO - 10.5281/zenodo.22104938 UR - https://doi.org/10.5281/zenodo.22104938 ER -
APA
Lei, Z., Bifeng, Y., & TIng, S. (2026). TCAD-Based Mechanism-Resolved Modeling of Displacement-Damage and Interface-Trap Contributions to Dark Current in BSI Pinned Photodiodes. https://doi.org/10.5281/zenodo.22104938