Data and code for "Competing Failure Modes in Residually Stressed Thin Films on Flexible Substrates: Wrinkling, Channel Cracking, and Their Coupling"
- DOI
- 10.5281/zenodo.23463414
- Published
- 2026
- Container
- Not recorded
- Publisher
- Zenodo
- Open access
- yes
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limited evidence Score 47/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.
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Cite this work
BibTeX
@article{allodium:10.5281/zenodo.23463414,
title = {Data and code for "Competing Failure Modes in Residually Stressed Thin Films on Flexible Substrates: Wrinkling, Channel Cracking, and Their Coupling"},
author = {Jun, Li and Xinhao, Tu and Linan, Li and Kai, Kang and Yongcheng, Ji},
year = {2026},
doi = {10.5281/zenodo.23463414},
url = {https://doi.org/10.5281/zenodo.23463414}
}RIS
TY - JOUR TI - Data and code for "Competing Failure Modes in Residually Stressed Thin Films on Flexible Substrates: Wrinkling, Channel Cracking, and Their Coupling" AU - Jun, Li AU - Xinhao, Tu AU - Linan, Li AU - Kai, Kang AU - Yongcheng, Ji PY - 2026 DO - 10.5281/zenodo.23463414 UR - https://doi.org/10.5281/zenodo.23463414 ER -
APA
Li, J., Tu, X., Li, L., Kang, K., & Ji, Y. (2026). Data and code for "Competing Failure Modes in Residually Stressed Thin Films on Flexible Substrates: Wrinkling, Channel Cracking, and Their Coupling". https://doi.org/10.5281/zenodo.23463414