Compensation of Time-of-Flight Drift Using an Internal Reference Ion during Long-Duration LIMAS Depth Profiling

Ken-ichi Bajo

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DOI: 10.5702/massspectrometry.a0201
Published: 2026-10-30
Container: Mass Spectrometry
Publisher: The Mass Spectrometry Society of Japan
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.5702/massspectrometry.a0201,
  title = {Compensation of Time-of-Flight Drift Using an Internal Reference Ion during Long-Duration LIMAS Depth Profiling},
  author = {Ken-ichi Bajo},
  year = {2026},
  journal = {Mass Spectrometry},
  doi = {10.5702/massspectrometry.a0201},
  url = {https://doi.org/10.5702/massspectrometry.a0201}
}

RIS

TY  - JOUR
TI  - Compensation of Time-of-Flight Drift Using an Internal Reference Ion during Long-Duration LIMAS Depth Profiling
AU  - Ken-ichi Bajo
PY  - 2026
JO  - Mass Spectrometry
DO  - 10.5702/massspectrometry.a0201
UR  - https://doi.org/10.5702/massspectrometry.a0201
ER  -

APA

Bajo, K. (2026). Compensation of Time-of-Flight Drift Using an Internal Reference Ion during Long-Duration LIMAS Depth Profiling. Mass Spectrometry. https://doi.org/10.5702/massspectrometry.a0201

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crossref · retrieved 2026-11-07T11:52:14.457Z