Automated Cocoa Bean Classification and Defect Detection Based on ASEAN Standard Using Image Processing and Feature-Based Analysis
- DOI
- 10.64823/ijeee.2601005
- Published
- 2026-09-14
- Container
- International Journal of Electrical and Electronics Engineering
- Publisher
- IORO Publications
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.64823/ijeee.2601005,
title = {Automated Cocoa Bean Classification and Defect Detection Based on ASEAN Standard Using Image Processing and Feature-Based Analysis},
author = {Jennifer Natnat},
year = {2026},
journal = {International Journal of Electrical and Electronics Engineering},
doi = {10.64823/ijeee.2601005},
url = {https://doi.org/10.64823/ijeee.2601005}
}RIS
TY - JOUR TI - Automated Cocoa Bean Classification and Defect Detection Based on ASEAN Standard Using Image Processing and Feature-Based Analysis AU - Jennifer Natnat PY - 2026 JO - International Journal of Electrical and Electronics Engineering DO - 10.64823/ijeee.2601005 UR - https://doi.org/10.64823/ijeee.2601005 ER -
APA
Natnat, J. (2026). Automated Cocoa Bean Classification and Defect Detection Based on ASEAN Standard Using Image Processing and Feature-Based Analysis. International Journal of Electrical and Electronics Engineering. https://doi.org/10.64823/ijeee.2601005
Source records
- crossref · retrieved 2026-09-26T16:51:31.840Z