Etude des comportements mémoires dans des dispositifs intégrés à base d’isolants de Mott V2O3 : Cr

Killian Veyret

DOI: 10.70675/11ee1d30zcda9z4ec5z9e19z98ac7a0d1c84
Published: 2025-11-13
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Open access: yes

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Cite this work

BibTeX

@article{allodium:10.70675/11ee1d30zcda9z4ec5z9e19z98ac7a0d1c84,
  title = {Etude des comportements mémoires dans des dispositifs intégrés à base d’isolants de Mott V2O3 : Cr},
  author = {Killian Veyret},
  year = {2025},
  doi = {10.70675/11ee1d30zcda9z4ec5z9e19z98ac7a0d1c84},
  url = {https://doi.org/10.70675/11ee1d30zcda9z4ec5z9e19z98ac7a0d1c84}
}

RIS

TY  - JOUR
TI  - Etude des comportements mémoires dans des dispositifs intégrés à base d’isolants de Mott V2O3 : Cr
AU  - Killian Veyret
PY  - 2025
DO  - 10.70675/11ee1d30zcda9z4ec5z9e19z98ac7a0d1c84
UR  - https://doi.org/10.70675/11ee1d30zcda9z4ec5z9e19z98ac7a0d1c84
ER  -

APA

Veyret, K. (2025). Etude des comportements mémoires dans des dispositifs intégrés à base d’isolants de Mott V2O3 : Cr. https://doi.org/10.70675/11ee1d30zcda9z4ec5z9e19z98ac7a0d1c84

Source records

hal · retrieved 2026-11-10T20:06:09.035Z