Statistical Learning on Circular Domains For Advanced Process Control in Microelectronics

Esperan Padonou

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DOI: 10.70675/54a3b201z06b8z49aaz9f32z83854f394ee7
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Publisher: Agence Bibliographique de l'Enseignement Supérieur
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Cite this work

BibTeX

@article{allodium:10.70675/54a3b201z06b8z49aaz9f32z83854f394ee7,
  title = {Statistical Learning on Circular Domains For Advanced Process Control in Microelectronics},
  author = {Esperan Padonou},
  doi = {10.70675/54a3b201z06b8z49aaz9f32z83854f394ee7},
  url = {https://doi.org/10.70675/54a3b201z06b8z49aaz9f32z83854f394ee7}
}

RIS

TY  - JOUR
TI  - Statistical Learning on Circular Domains For Advanced Process Control in Microelectronics
AU  - Esperan Padonou
DO  - 10.70675/54a3b201z06b8z49aaz9f32z83854f394ee7
UR  - https://doi.org/10.70675/54a3b201z06b8z49aaz9f32z83854f394ee7
ER  -

APA

Padonou, E. (n.d.). Statistical Learning on Circular Domains For Advanced Process Control in Microelectronics. https://doi.org/10.70675/54a3b201z06b8z49aaz9f32z83854f394ee7

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crossref · retrieved 2026-09-26T18:07:51.340Z