STEM-EELS investigation of ferroelectric proximity effects in transition metal oxide thin films (SrRuO₃, NdNiO₃)

Chia-Ping Su

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DOI: 10.70675/669157dazdb99z44b6z978az4a385a27dacf
Published: Not recorded
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Publisher: Agence Bibliographique de l'Enseignement Supérieur
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Cite this work

BibTeX

@article{allodium:10.70675/669157dazdb99z44b6z978az4a385a27dacf,
  title = {STEM-EELS investigation of ferroelectric proximity effects in transition metal oxide thin films (SrRuO₃, NdNiO₃)},
  author = {Chia-Ping Su},
  doi = {10.70675/669157dazdb99z44b6z978az4a385a27dacf},
  url = {https://doi.org/10.70675/669157dazdb99z44b6z978az4a385a27dacf}
}

RIS

TY  - JOUR
TI  - STEM-EELS investigation of ferroelectric proximity effects in transition metal oxide thin films (SrRuO₃, NdNiO₃)
AU  - Chia-Ping Su
DO  - 10.70675/669157dazdb99z44b6z978az4a385a27dacf
UR  - https://doi.org/10.70675/669157dazdb99z44b6z978az4a385a27dacf
ER  -

APA

Su, C. (n.d.). STEM-EELS investigation of ferroelectric proximity effects in transition metal oxide thin films (SrRuO₃, NdNiO₃). https://doi.org/10.70675/669157dazdb99z44b6z978az4a385a27dacf

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crossref · retrieved 2026-09-27T00:05:18.896Z