Probabilistic Graphical Models with a Large Language Architecture for Failure Analysis Decision-making : Application to the Semiconductor Industry 4.0
- DOI
- 10.70675/91bc93acz4a0ez4dcezbba4z3853ab87ad4d
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- Publisher
- Agence Bibliographique de l'Enseignement Supérieur
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.70675/91bc93acz4a0ez4dcezbba4z3853ab87ad4d,
title = {Probabilistic Graphical Models with a Large Language Architecture for Failure Analysis Decision-making : Application to the Semiconductor Industry 4.0},
author = {Ifeanyi Kenneth Ezukwoke},
doi = {10.70675/91bc93acz4a0ez4dcezbba4z3853ab87ad4d},
url = {https://doi.org/10.70675/91bc93acz4a0ez4dcezbba4z3853ab87ad4d}
}RIS
TY - JOUR TI - Probabilistic Graphical Models with a Large Language Architecture for Failure Analysis Decision-making : Application to the Semiconductor Industry 4.0 AU - Ifeanyi Kenneth Ezukwoke DO - 10.70675/91bc93acz4a0ez4dcezbba4z3853ab87ad4d UR - https://doi.org/10.70675/91bc93acz4a0ez4dcezbba4z3853ab87ad4d ER -
APA
Ezukwoke, I. K. (n.d.). Probabilistic Graphical Models with a Large Language Architecture for Failure Analysis Decision-making : Application to the Semiconductor Industry 4.0. https://doi.org/10.70675/91bc93acz4a0ez4dcezbba4z3853ab87ad4d
Source records
- crossref · retrieved 2026-11-10T18:16:14.251Z