Backside absorbing layer microscopy : a new tool for the investigation of 2D materials

Kévin Jaouen

Open source

DOI: 10.70675/a849ad25z1491z4ab7z8bb2zc35657c6e544
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Publisher: Agence Bibliographique de l'Enseignement Supérieur
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Cite this work

BibTeX

@article{allodium:10.70675/a849ad25z1491z4ab7z8bb2zc35657c6e544,
  title = {Backside absorbing layer microscopy : a new tool for the investigation of 2D materials},
  author = {Kévin Jaouen},
  doi = {10.70675/a849ad25z1491z4ab7z8bb2zc35657c6e544},
  url = {https://doi.org/10.70675/a849ad25z1491z4ab7z8bb2zc35657c6e544}
}

RIS

TY  - JOUR
TI  - Backside absorbing layer microscopy : a new tool for the investigation of 2D materials
AU  - Kévin Jaouen
DO  - 10.70675/a849ad25z1491z4ab7z8bb2zc35657c6e544
UR  - https://doi.org/10.70675/a849ad25z1491z4ab7z8bb2zc35657c6e544
ER  -

APA

Jaouen, K. (n.d.). Backside absorbing layer microscopy : a new tool for the investigation of 2D materials. https://doi.org/10.70675/a849ad25z1491z4ab7z8bb2zc35657c6e544

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crossref · retrieved 2026-11-09T20:07:00.000Z