Study and Development of Innovative ESD Protection Solutions for Low Noise Amplifiers in RF Applications Incorporating Statistical Analysis of ESD-Induced Effects

Thalis Da Costa Guedes

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DOI: 10.70675/cb9f9e45zdb7az4cfdz8aa5zb67f27963c04
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Publisher: Agence Bibliographique de l'Enseignement Supérieur
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Cite this work

BibTeX

@article{allodium:10.70675/cb9f9e45zdb7az4cfdz8aa5zb67f27963c04,
  title = {Study and Development of Innovative ESD Protection Solutions for Low Noise Amplifiers in RF Applications Incorporating Statistical Analysis of ESD-Induced Effects},
  author = {Thalis Da Costa Guedes},
  doi = {10.70675/cb9f9e45zdb7az4cfdz8aa5zb67f27963c04},
  url = {https://doi.org/10.70675/cb9f9e45zdb7az4cfdz8aa5zb67f27963c04}
}

RIS

TY  - JOUR
TI  - Study and Development of Innovative ESD Protection Solutions for Low Noise Amplifiers in RF Applications Incorporating Statistical Analysis of ESD-Induced Effects
AU  - Thalis Da Costa Guedes
DO  - 10.70675/cb9f9e45zdb7az4cfdz8aa5zb67f27963c04
UR  - https://doi.org/10.70675/cb9f9e45zdb7az4cfdz8aa5zb67f27963c04
ER  -

APA

Guedes, T. D. C. (n.d.). Study and Development of Innovative ESD Protection Solutions for Low Noise Amplifiers in RF Applications Incorporating Statistical Analysis of ESD-Induced Effects. https://doi.org/10.70675/cb9f9e45zdb7az4cfdz8aa5zb67f27963c04

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crossref · retrieved 2026-11-10T16:38:46.341Z