Evaluation de la durée de vie de composants électroniques de puissance commerciaux soumis à plusieurs tests de vieillissement et détermination des mécanismes de défaillance

Guillaume Parent

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DOI: 10.70675/eadedc55z5600z4341zaca5zb15cbc0c88c3
Published: Not recorded
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Publisher: Agence Bibliographique de l'Enseignement Supérieur
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Cite this work

BibTeX

@article{allodium:10.70675/eadedc55z5600z4341zaca5zb15cbc0c88c3,
  title = {Evaluation de la durée de vie de composants électroniques de puissance commerciaux soumis à plusieurs tests de vieillissement et détermination des mécanismes de défaillance},
  author = {Guillaume Parent},
  doi = {10.70675/eadedc55z5600z4341zaca5zb15cbc0c88c3},
  url = {https://doi.org/10.70675/eadedc55z5600z4341zaca5zb15cbc0c88c3}
}

RIS

TY  - JOUR
TI  - Evaluation de la durée de vie de composants électroniques de puissance commerciaux soumis à plusieurs tests de vieillissement et détermination des mécanismes de défaillance
AU  - Guillaume Parent
DO  - 10.70675/eadedc55z5600z4341zaca5zb15cbc0c88c3
UR  - https://doi.org/10.70675/eadedc55z5600z4341zaca5zb15cbc0c88c3
ER  -

APA

Parent, G. (n.d.). Evaluation de la durée de vie de composants électroniques de puissance commerciaux soumis à plusieurs tests de vieillissement et détermination des mécanismes de défaillance. https://doi.org/10.70675/eadedc55z5600z4341zaca5zb15cbc0c88c3

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crossref · retrieved 2026-09-26T12:20:49.132Z