200kV透過電子顕微鏡（JEM-2100）によるデータ駆動型エレクトロニクス材料開発

Naoki Ohashi

DOI: 10.71947/arim.jpmxp1223nm5182-2
Published: 2026
Container: Not recorded
Publisher: Advanced Research Infrastructure for Materials and Nanotechnology in Japan(ARIM)
Open access: no

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Cite this work

BibTeX

@article{allodium:10.71947/arim.jpmxp1223nm5182-2,
  title = {200kV透過電子顕微鏡（JEM-2100）によるデータ駆動型エレクトロニクス材料開発},
  author = {Naoki Ohashi},
  year = {2026},
  doi = {10.71947/arim.jpmxp1223nm5182-2},
  url = {https://doi.org/10.71947/arim.jpmxp1223nm5182-2}
}

RIS

TY  - JOUR
TI  - 200kV透過電子顕微鏡（JEM-2100）によるデータ駆動型エレクトロニクス材料開発
AU  - Naoki Ohashi
PY  - 2026
DO  - 10.71947/arim.jpmxp1223nm5182-2
UR  - https://doi.org/10.71947/arim.jpmxp1223nm5182-2
ER  -

APA

Ohashi, N. (2026). 200kV透過電子顕微鏡（JEM-2100）によるデータ駆動型エレクトロニクス材料開発. https://doi.org/10.71947/arim.jpmxp1223nm5182-2

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datacite · retrieved 2026-09-27T15:41:58.491Z