Experimental Comparison of Half-Value Layer Measurements Using a Solid-State X-ray Meter and an Ionization Chamber in General Radiography

Kunihiko Katagiri, Genta Ito, Toshiki Hirakado

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DOI: 10.7759/cureus.117313
Published: 2026-10-01
Container: Cureus
Publisher: Springer Science and Business Media LLC
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.7759/cureus.117313,
  title = {Experimental Comparison of Half-Value Layer Measurements Using a Solid-State X-ray Meter and an Ionization Chamber in General Radiography},
  author = {Kunihiko Katagiri and Genta Ito and Toshiki Hirakado},
  year = {2026},
  journal = {Cureus},
  doi = {10.7759/cureus.117313},
  url = {https://doi.org/10.7759/cureus.117313}
}

RIS

TY  - JOUR
TI  - Experimental Comparison of Half-Value Layer Measurements Using a Solid-State X-ray Meter and an Ionization Chamber in General Radiography
AU  - Kunihiko Katagiri
AU  - Genta Ito
AU  - Toshiki Hirakado
PY  - 2026
JO  - Cureus
DO  - 10.7759/cureus.117313
UR  - https://doi.org/10.7759/cureus.117313
ER  -

APA

Katagiri, K., Ito, G., & Hirakado, T. (2026). Experimental Comparison of Half-Value Layer Measurements Using a Solid-State X-ray Meter and an Ionization Chamber in General Radiography. Cureus. https://doi.org/10.7759/cureus.117313

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crossref · retrieved 2026-11-03T22:45:26.656Z