Built-in self test based on reseeding of linear feedback shift registers

Venkataraman, Srikanth

DOI: 10.82308/12592
Published: 1993
Container: Not recorded
Publisher: McGill University
Open access: no

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Cite this work

BibTeX

@article{allodium:10.82308/12592,
  title = {Built-in self test based on reseeding of linear feedback shift registers},
  author = {Venkataraman, Srikanth},
  year = {1993},
  doi = {10.82308/12592},
  url = {https://doi.org/10.82308/12592}
}

RIS

TY  - JOUR
TI  - Built-in self test based on reseeding of linear feedback shift registers
AU  - Venkataraman, Srikanth
PY  - 1993
DO  - 10.82308/12592
UR  - https://doi.org/10.82308/12592
ER  -

APA

Srikanth, V. (1993). Built-in self test based on reseeding of linear feedback shift registers. https://doi.org/10.82308/12592

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datacite · retrieved 2026-11-09T06:01:15.996Z