Significance of Using Scanning Electron Microscopy with Energy Dispersive X-ray Spectrometry (SEM-EDX) for Analysis of Evidence Material in Forensic Sciences

Jumisree Sarmah Pathak, Arvind Kumar Saxena

Open source

DOI
10.9734/ajr2p/2024/v8i2159
Published
2024-04-01
Container
Asian Journal of Research and Reviews in Physics
Publisher
Sciencedomain International
Open access
unknown

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BibTeX

@article{allodium:10.9734/ajr2p/2024/v8i2159,
  title = {Significance of Using Scanning Electron Microscopy with Energy Dispersive X-ray Spectrometry  (SEM-EDX) for Analysis of Evidence Material in Forensic Sciences},
  author = {Jumisree Sarmah Pathak and Arvind Kumar Saxena},
  year = {2024},
  journal = {Asian Journal of Research and Reviews in Physics},
  doi = {10.9734/ajr2p/2024/v8i2159},
  url = {https://doi.org/10.9734/ajr2p/2024/v8i2159}
}

RIS

TY  - JOUR
TI  - Significance of Using Scanning Electron Microscopy with Energy Dispersive X-ray Spectrometry  (SEM-EDX) for Analysis of Evidence Material in Forensic Sciences
AU  - Jumisree Sarmah Pathak
AU  - Arvind Kumar Saxena
PY  - 2024
JO  - Asian Journal of Research and Reviews in Physics
DO  - 10.9734/ajr2p/2024/v8i2159
UR  - https://doi.org/10.9734/ajr2p/2024/v8i2159
ER  - 

APA

Pathak, J. S., & Saxena, A. K. (2024). Significance of Using Scanning Electron Microscopy with Energy Dispersive X-ray Spectrometry (SEM-EDX) for Analysis of Evidence Material in Forensic Sciences. Asian Journal of Research and Reviews in Physics. https://doi.org/10.9734/ajr2p/2024/v8i2159

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