A Theoretical Framework for Ensuring Safety in Semiconductor Manufacturing through Process Optimization and Risk Assessment
- DOI
- 10.9734/jmsrr/2025/v8i1388
- Published
- 2025-02-14
- Container
- Journal of Materials Science Research and Reviews
- Publisher
- Sciencedomain International
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.9734/jmsrr/2025/v8i1388,
title = {A Theoretical Framework for Ensuring Safety in Semiconductor Manufacturing through Process Optimization and Risk Assessment},
author = {Enoch Oluwadunmininu Ogunnowo and Elemele Ogu and Peter Ifechukwude Egbumokei and Ikiomoworio Nicholas Dienagha and Wags Numoipiri Digitemie},
year = {2025},
journal = {Journal of Materials Science Research and Reviews},
doi = {10.9734/jmsrr/2025/v8i1388},
url = {https://doi.org/10.9734/jmsrr/2025/v8i1388}
}RIS
TY - JOUR TI - A Theoretical Framework for Ensuring Safety in Semiconductor Manufacturing through Process Optimization and Risk Assessment AU - Enoch Oluwadunmininu Ogunnowo AU - Elemele Ogu AU - Peter Ifechukwude Egbumokei AU - Ikiomoworio Nicholas Dienagha AU - Wags Numoipiri Digitemie PY - 2025 JO - Journal of Materials Science Research and Reviews DO - 10.9734/jmsrr/2025/v8i1388 UR - https://doi.org/10.9734/jmsrr/2025/v8i1388 ER -
APA
Ogunnowo, E. O., Ogu, E., Egbumokei, P. I., Dienagha, I. N., & Digitemie, W. N. (2025). A Theoretical Framework for Ensuring Safety in Semiconductor Manufacturing through Process Optimization and Risk Assessment. Journal of Materials Science Research and Reviews. https://doi.org/10.9734/jmsrr/2025/v8i1388
Source records
- crossref · retrieved 2026-09-25T20:49:08.636Z