Ion-surface interactions and analysis
This cluster of papers focuses on the use of ion beam techniques, such as Secondary Ion Mass Spectrometry (SIMS) and swift heavy ions, for surface analysis, nanoscale patterning, and molecular imaging. It covers a wide range of applications including surface engineering, nanostructure fabrication, and depth profiling of biological samples.
Papers listed on taxonomy pages are the top few works per node from the OpenAlex snapshot. That list is not exhaustive and is not an endorsement. The topic map and the journal registry remain separate: there is still no authoritative topic-to-venue or topic-to-organization edge. Search is a lexical lookup, not a claim that a venue publishes a topic.