Electron and X-Ray Spectroscopy Techniques
This cluster of papers focuses on surface analysis and electron spectroscopy techniques, including X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM), electron inelastic mean free paths, ambient pressure photoelectron spectroscopy, and applications in surface science and nanomaterials characterization. It covers topics such as quantitative surface analysis, secondary electron emission, environmental scanning electron microscopy, and hard X-ray photoemission spectroscopy.
Papers listed on taxonomy pages are the top few works per node from the OpenAlex snapshot. That list is not exhaustive and is not an endorsement. The topic map and the journal registry remain separate: there is still no authoritative topic-to-venue or topic-to-organization edge. Search is a lexical lookup, not a claim that a venue publishes a topic.
Keywords
- Ambient Pressure Photoelectron Spectroscopy
- Electron Inelastic Mean Free Paths
- Environmental Scanning Electron Microscopy
- Hard X-ray Photoemission Spectroscopy
- Nanomaterials Characterization
- Quantitative Surface Analysis
- Scanning Electron Microscopy
- Secondary Electron Emission
- Surface Science
- X-ray Photoelectron Spectroscopy