Simulating Model for Nanoscale Oxide Layers Fabrication with Atomic Force Microscopy
- Type
- Retraction
- Notice date
- 11/4/2010 0:00
- Journal
- 2010 International Conference on Computer Application and System Modeling (ICCASM 2010)
- Publisher
- IEEE: Institute of Electrical and Electronics Engineers
- Notice DOI
- 10.1109/iccasm.2010.5619308
- Original paper DOI
- Not recorded