Generation of efficient test data using path selection strategy with elitist GA in regression testing

Type: Retraction
Notice date: 9/7/2010 0:00
Journal: 2010 3rd Intl Conference on Computer Science and Information Technology (ICCSIT)
Publisher: IEEE: Institute of Electrical and Electronics Engineers
Notice DOI: 10.1109/iccsit.2010.5564915
Original paper DOI: 10.1109/iccsit.2010.5564915

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