A Study of Support Vector Regression for Surface Characteristics in-process Optical Measurement
- Type
- Retraction
- Notice date
- 8/26/2010 0:00
- Journal
- 2010 2nd International Conference on Mechanical and Electronics Engineering
- Publisher
- IEEE: Institute of Electrical and Electronics Engineers
- Notice DOI
- 10.1109/icmee.2010.5558495
- Original paper DOI
- Not recorded