Risk measurement of Chinese SMEB stock market: An APARCH-SKST approach
- Type
- Retraction
- Notice date
- 8/23/2010 0:00
- Journal
- 2010 IEEE International Conference on Advanced Management Science (ICAMS 2010)
- Publisher
- IEEE: Institute of Electrical and Electronics Engineers
- Notice DOI
- 10.1109/icams.2010.5553214
- Original paper DOI
- 10.1109/icams.2010.5553214