A study on Bayesian design of degradation tests with the inverse Gaussian processes

Type: Retraction
Notice date: 10/10/2013 0:00
Journal: 2013 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering
Publisher: IEEE: Institute of Electrical and Electronics Engineers
Notice DOI: 10.1109/qr2mse.2013.6625707
Original paper DOI: 10.1109/qr2mse.2013.6625707

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