Investigation on V2O5 Thin Films for Field Effect Transistor Applications
- Type
- Retraction
- Notice date
- 12/29/2023 0:00
- Journal
- Advances in Materials Science and Engineering
- Publisher
- Hindawi
- Notice DOI
- 10.1155/2023/9804082
- Original paper DOI
- 10.1155/2021/2414589
Reasons
- Compromised Peer Review
- Investigation by Journal/Publisher
- Investigation by Third Party
- Paper Mill
- Unreliable Results and/or Conclusions