Autonomous group testing based fault tolerance in reconfigurable logic devices
- Type
- Retraction
- Notice date
- 7/11/2013 0:00
- Journal
- Journal of Circuits, Systems, and Computers
- Publisher
- World Scientific Publishing Company
- Notice DOI
- 10.1142/s0218126613930018
- Original paper DOI
- 10.1142/s0218126610006827