Influence of Surface Topography and Chemical Structure on Wettability of Electrodeposited ZnO Thin Films
- Type
- Retraction
- Notice date
- 8/1/2011 0:00
- Journal
- Journal of Applied Physics
- Publisher
- American Institute of Physics (AIP Publishing)
- Notice DOI
- 10.1063/1.3615932
- Original paper DOI
- 10.1063/1.3493735