A method of improving precision in software testing based on defect patterns
- Type
- Retraction
- Notice date
- 6/26/2009 0:00
- Journal
- 2009 International Conference on Industrial and Information Systems
- Publisher
- IEEE: Institute of Electrical and Electronics Engineers
- Notice DOI
- 10.1109/iis.2009.14
- Original paper DOI
- 10.1109/iis.2009.14