Retraction notices

Nanocharacterization of Titanium Nitride Thin Films Obtained by Reactive Magnetron Sputtering

Type: Retraction
Notice date: 8/1/2017 0:00
Journal: JOM
Publisher: Springer
Notice DOI: 10.1007/s11837-015-1460-2
Original paper DOI: 10.1007/s11837-015-1460-2

Reasons

Duplication of/in Article

Matching venue names

Name match only, not an authoritative journal identifier.

JOM