Radiation Effects in Electronics
This cluster of papers focuses on the challenges and techniques for fault tolerance in electronic systems, particularly in the context of soft errors, radiation effects, and single event upsets in CMOS technology. It explores various methods for error detection, reliability evaluation, and mitigation of transient faults in nanoelectronics.
Papers listed on taxonomy pages are the top few works per node from the OpenAlex snapshot. That list is not exhaustive and is not an endorsement. The topic map and the journal registry remain separate: there is still no authoritative topic-to-venue or topic-to-organization edge. Search is a lexical lookup, not a claim that a venue publishes a topic.