Spectral diffuse reflectance measurements of gadolinia, silica thin film systems using synchrotron radiation
- Type
- Retraction
- Notice date
- 3/15/2007 0:00
- Journal
- Applied Surface Science
- Publisher
- Elsevier
- Notice DOI
- 10.1016/j.apsusc.2006.10.032
- Original paper DOI
- 10.1016/j.apsusc.2006.10.032