1/f Noise Measurements on Indium Antimonide Metal-oxide-semiconductor Field-effect Transistors
- Type
- Retraction
- Notice date
- 5/1/2011 0:00
- Journal
- Journal of Applied Physics
- Publisher
- American Institute of Physics (AIP Publishing)
- Notice DOI
- 10.1063/1.3582040
- Original paper DOI
- 10.1063/1.370630