Capacitance pin defect detection based on deep learning
- Type
- Retraction
- Notice date
- 3/27/2024 0:00
- Journal
- Journal of Combinatorial Optimization
- Publisher
- Springer - Nature Publishing Group
- Notice DOI
- 10.1007/s10878-024-01130-0
- Original paper DOI
- 10.1007/s10878-022-00904-8
Reasons
- Author Unresponsive
- Concerns/Issues about Referencing/Attributions
- Concerns/Issues about Peer Review
- Compromised Peer Review
- Investigation by Journal/Publisher
- Rogue Editor
- Unreliable Results and/or Conclusions